Scanning electron microscope (SEM)
In the SEM an electron beam hits the sample, from wich numerous particles are reissued (secondary and backscattered electrons, X-rays, photons, etc...) and they supply various information.
Using electrons reissued from the sample (secondary and backscattered) it is possible to obtain images at high magnification, through which it is possible to go to study the morphology of the sample, the presence of defects, precipitates, etc...
Moreover compositional information can be obtained sending the X-rays reissued to a EDS detector, from which qualitative and quantitative microanalyses are obtained.
Both metallic and polymeric samples are analyzable, carrying out an opportune metallization in order to make conductive the sample.
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SEM image of an eutectoidic steel.
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